SCAN926260TUF/NOPB Texas Instruments - Yeehing Electronics

Six 1 to 10 bus LVDS deserializers with IEEE 1149.1 and at-speed BIST

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For more information, please refer to datasheet

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The SCAN926260 integrates six 10-bit deserializer devices into a single chip. The SCAN926260 can simultaneously deserialize up to six data streams that have been serialized by TI’s 10-bit Bus LVDS serializers. In addition, the SCAN926260 is compliant with IEEE standard 1149.1 and also features an At-Speed Built-In Self Test (BIST). For more details, please see the sections titled IEEE 1149.1 Test Modes and BIST Alone Test Modes.