Description
SCAN926260TUFX/NOPB Texas Instruments - Yeehing Electronics
Six 1 to 10 bus LVDS deserializers with IEEE 1149.1 and at-speed BIST
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 26.154 |
100 — 249 | 23.248 |
250 — 999 | 19.111 |
1,000 + | 11.97 |
The above prices are for reference only.
Specifications
Manufacturer | Texas Instruments |
Product Category | LVDS Interface IC |
RoHS | Y |
Type | LVTTL |
Number of Drivers | 10 Driver |
Number of Receivers | 6 Receiver |
Data Rate | 660 Mb/s |
Input Type | LVDS |
Supply Voltage - Max | 3.6 V |
Supply Voltage - Min | 3 V |
Minimum Operating Temperature | - 40 C |
Maximum Operating Temperature | + 85 C |
Mounting Style | SMD/SMT |
Package / Case | LBGA-196 |
Packaging | Reel |
Height | 1.03 mm |
Input Voltage MAX | 50 mV |
Length | 15 mm |
Series | SCAN926260 |
Width | 15 mm |
Brand | Texas Instruments |
Input Voltage MIN | - 50 mV |
Moisture Sensitive | Yes |
Operating Supply Current | 600 mA |
Operating Supply Voltage | 3.3 V |
Pd - Power Dissipation | 3.7 W |
Product Type | LVDS Interface IC |
Factory Pack Quantity | 1000 |
Subcategory | Interface ICs |
For more information, please refer to datasheet
Documents
SCAN926260TUFX/NOPB Datasheet |
More Information
The SCAN926260 integrates six 10-bit deserializer devices into a single chip. The SCAN926260 can simultaneously deserialize up to six data streams that have been serialized by TI’s 10-bit Bus LVDS serializers. In addition, the SCAN926260 is compliant with IEEE standard 1149.1 and also features an At-Speed Built-In Self Test (BIST). For more details, please see the sections titled IEEE 1149.1 Test Modes and BIST Alone Test Modes.