Description
SCANSTA111SMX/NOPB Texas Instruments - Yeehing Electronics
Enhanced scan bridge multidrop addressable IEEE 1149.1 (JTAG) port
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 8.766 |
100 — 249 | 7.146 |
250 — 999 | 5.617 |
1,000 + | 3.33 |
The above prices are for reference only.
Specifications
Manufacturer | Texas Instruments |
Product Category | Interface - Specialized |
RoHS | Y |
Type | Enhanced SCAN Bridge Multidrop Addressable IEEEs |
Operating Supply Voltage | 3 V to 3.6 V |
Operating Supply Current | 1.65 mA |
Minimum Operating Temperature | - 40 C |
Maximum Operating Temperature | + 85 C |
Mounting Style | SMD/SMT |
Package / Case | nFBGA-49 |
Packaging | Reel |
Series | SCANSTA111 |
Brand | Texas Instruments |
Moisture Sensitive | Yes |
Product Type | Interface - Specialized |
Protocol Supported | Boundary Scan |
Factory Pack Quantity | 2000 |
Subcategory | Interface ICs |
Supply Voltage - Max | 3.6 V |
For more information, please refer to datasheet
Documents
SCANSTA111SMX/NOPB Datasheet |
More Information
The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be performed on one port while other scan chains are simultaneously tested.