SN74ABT18504PM Texas Instruments - Yeehing Electronics

Scan Test Devices With 20-Bit Universal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	14.741
100 — 249	12.876
250 — 999	9.928
1,000 +	6.22

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Series	SN74ABT18504
Operating Supply Voltage	5 V
Minimum Operating Temperature	- 40 C
Maximum Operating Temperature	+ 85 C
Package / Case	LQFP-64
Packaging	Tray
Function	Scan Test Device with Universal Bus Transceiver
Number of Circuits	1
Operating Temperature Range	- 40 C to + 85 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Moisture Sensitive	Yes
Product Type	Specialty Function Logic
Propagation Delay Time	6.1 ns
Factory Pack Quantity	160
Subcategory	Logic ICs
Tradename	SCOPE
Unit Weight	0.012088 oz

For more information, please refer to datasheet

Documents

SN74ABT18504PM Datasheet

More Information

The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.