Description
SN74ABT18640DL Texas Instruments - Yeehing Electronics
Scan Test Devices With 18-Bit Inverting Bus Transceivers
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 10.483 |
100 — 249 | 9.157 |
250 — 999 | 7.06 |
1,000 + | 4.42 |
The above prices are for reference only.
Specifications
Manufacturer | Texas Instruments |
Product Category | Specialty Function Logic |
RoHS | Y |
Series | SN74ABT18640 |
Operating Supply Voltage | 4.5 V to 5.5 V |
Minimum Operating Temperature | - 40 C |
Maximum Operating Temperature | + 85 C |
Package / Case | SSOP-56 |
Packaging | Tube |
Function | Scan Test Device with Bus Transceiver |
Number of Circuits | 2 |
Operating Temperature Range | - 40 C to + 85 C |
Brand | Texas Instruments |
Mounting Style | SMD/SMT |
Product Type | Specialty Function Logic |
Propagation Delay Time | 4.6 ns |
Factory Pack Quantity | 20 |
Subcategory | Logic ICs |
Tradename | SCOPE |
Unit Weight | 0.024508 oz |
For more information, please refer to datasheet
Documents
SN74ABT18640DL Datasheet |
More Information
The 'ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.