SN74ABT18652PM Texas Instruments - Yeehing Electronics

Scan Test Devices With 18-Bit Bus Transceivers And Registers

Pricing (USD)

Quantity	Unit Price
1 — 99	15.725
100 — 249	13.736
250 — 999	10.591
1,000 +	6.63

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Minimum Operating Temperature	-40
Maximum Operating Temperature	85
Factory Pack Quantity	160
Package | Pins	LQFP (PM) | 64

For more information, please refer to datasheet

Documents

SN74ABT18652PM Datasheet

More Information

This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE™ testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port (TAP) interface.