SN74ABT8245DWR Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	5.22
100 — 249	4.256
250 — 999	3.345
1,000 +	1.99

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SN74ABT8245DWR Datasheet

More Information

The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.