SN74ABT8543DW Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Registered Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	10.619
100 — 249	9.276
250 — 999	7.152
1,000 +	4.48

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Series	SN74ABT8543
Operating Supply Voltage	4.5 V to 5.5 V
Minimum Operating Temperature	- 40 C
Maximum Operating Temperature	+ 85 C
Package / Case	SOIC-28
Packaging	Tube
Function	Scan Test Device with Latched Transceiver
Number of Circuits	2
Operating Temperature Range	- 40 C to + 85 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Product Type	Specialty Function Logic
Propagation Delay Time	4.5 ns
Factory Pack Quantity	20
Subcategory	Logic ICs
Tradename	SCOPE
Unit Weight	0.025778 oz

For more information, please refer to datasheet

Documents

SN74ABT8543DW Datasheet

More Information

The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.