Texas Instruments
SN74ABT8543DW
SN74ABT8543DW
Regular price
$4.48 USD
Regular price
Sale price
$4.48 USD
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SN74ABT8543DW Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Registered Bus Transceivers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 10.619 |
| 100 — 249 | 9.276 |
| 250 — 999 | 7.152 |
| 1,000 + | 4.48 |
The above prices are for reference only.
Specifications
| Manufacturer | Texas Instruments |
| Product Category | Specialty Function Logic |
| RoHS | Y |
| Series | SN74ABT8543 |
| Operating Supply Voltage | 4.5 V to 5.5 V |
| Minimum Operating Temperature | - 40 C |
| Maximum Operating Temperature | + 85 C |
| Package / Case | SOIC-28 |
| Packaging | Tube |
| Function | Scan Test Device with Latched Transceiver |
| Number of Circuits | 2 |
| Operating Temperature Range | - 40 C to + 85 C |
| Brand | Texas Instruments |
| Mounting Style | SMD/SMT |
| Product Type | Specialty Function Logic |
| Propagation Delay Time | 4.5 ns |
| Factory Pack Quantity | 20 |
| Subcategory | Logic ICs |
| Tradename | SCOPE |
| Unit Weight | 0.025778 oz |
For more information, please refer to datasheet
Documents
| SN74ABT8543DW Datasheet |
More Information
The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
