SN74ABT8646DL


YeeHing #: Y009-SN74ABT8646DL
Inventory: 8800

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Description

SN74ABT8646DL Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Bus Transceivers And Registers

Pricing (USD)

Quantity Unit Price
1 — 99 11.64
100 — 249 9.489
250 — 999 7.458
1,000 + 4.43

The above prices are for reference only.

Specifications

Manufacturer Texas Instruments
Product Category Specialty Function Logic
RoHS Y
Series SN74ABT8646
Operating Supply Voltage 4.5 V to 5.5 V
Minimum Operating Temperature - 40 C
Maximum Operating Temperature + 85 C
Package / Case SSOP-28
Packaging Reel
Function Scan Test Device with Bus Transceiver / Register
Number of Circuits 1
Operating Temperature Range - 40 C to + 85 C
Brand Texas Instruments
Mounting Style SMD/SMT
Product Type Specialty Function Logic
Propagation Delay Time 5.3 ns
Factory Pack Quantity 1000
Subcategory Logic ICs
Tradename SCOPE
Unit Weight 0.025045 oz

For more information, please refer to datasheet

Documents

SN74ABT8646DL Datasheet

More Information

The ’ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

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