Description
SN74ABT8646DL Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Bus Transceivers And Registers
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 11.64 |
100 — 249 | 9.489 |
250 — 999 | 7.458 |
1,000 + | 4.43 |
The above prices are for reference only.
Specifications
Manufacturer | Texas Instruments |
Product Category | Specialty Function Logic |
RoHS | Y |
Series | SN74ABT8646 |
Operating Supply Voltage | 4.5 V to 5.5 V |
Minimum Operating Temperature | - 40 C |
Maximum Operating Temperature | + 85 C |
Package / Case | SSOP-28 |
Packaging | Reel |
Function | Scan Test Device with Bus Transceiver / Register |
Number of Circuits | 1 |
Operating Temperature Range | - 40 C to + 85 C |
Brand | Texas Instruments |
Mounting Style | SMD/SMT |
Product Type | Specialty Function Logic |
Propagation Delay Time | 5.3 ns |
Factory Pack Quantity | 1000 |
Subcategory | Logic ICs |
Tradename | SCOPE |
Unit Weight | 0.025045 oz |
For more information, please refer to datasheet
Documents
SN74ABT8646DL Datasheet |
More Information
The ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.