Description
SN74ABT8646DW Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Bus Transceivers And Registers
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 9.7 |
100 — 249 | 7.908 |
250 — 999 | 6.216 |
1,000 + | 3.69 |
The above prices are for reference only.
Specifications
Manufacturer | Texas Instruments |
Product Category | Specialty Function Logic |
RoHS | Y |
Package / Case | SOIC-28 |
Packaging | Reel |
Brand | Texas Instruments |
Mounting Style | SMD/SMT |
Product Type | Specialty Function Logic |
Factory Pack Quantity | 1 |
Subcategory | Logic ICs |
Unit Weight | 0.078125 oz |
For more information, please refer to datasheet
Documents
SN74ABT8646DW Datasheet |
More Information
The ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.