SN74ABT8646DW


YeeHing #: Y009-SN74ABT8646DW
Inventory: 3600

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Description

SN74ABT8646DW Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Bus Transceivers And Registers

Pricing (USD)

Quantity Unit Price
1 — 99 9.7
100 — 249 7.908
250 — 999 6.216
1,000 + 3.69

The above prices are for reference only.

Specifications

Manufacturer Texas Instruments
Product Category Specialty Function Logic
RoHS Y
Package / Case SOIC-28
Packaging Reel
Brand Texas Instruments
Mounting Style SMD/SMT
Product Type Specialty Function Logic
Factory Pack Quantity 1
Subcategory Logic ICs
Unit Weight 0.078125 oz

For more information, please refer to datasheet

Documents

SN74ABT8646DW Datasheet

More Information

The ’ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

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