SN74ABTH182646APM Texas Instruments - Yeehing Electronics

Scan Test Devices With 18-Bit Transceivers And Registers

Pricing (USD)

Quantity	Unit Price
1 — 99	17.357
100 — 249	15.161
250 — 999	11.69
1,000 +	7.32

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Series	SN74ABTH182646A
Operating Supply Voltage	5 V
Minimum Operating Temperature	- 40 C
Maximum Operating Temperature	+ 85 C
Package / Case	LQFP-64
Packaging	Tray
Function	Scan Test Device with Bus Transceiver / Register
Number of Circuits	2
Operating Temperature Range	- 40 C to + 85 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Moisture Sensitive	Yes
Product Type	Specialty Function Logic
Propagation Delay Time	7 ns
Factory Pack Quantity	160
Subcategory	Logic ICs
Tradename	SCOPE
Unit Weight	0.012088 oz

For more information, please refer to datasheet

Documents

SN74ABTH182646APM Datasheet

More Information

The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.