SN74BCT8244ADW Texas Instruments - Yeehing Electronics

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers

Pricing (USD)

Quantity	Unit Price
1 — 99	9.728
100 — 249	8.497
250 — 999	6.551
1,000 +	4.10

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Product	Boundry Scan JTAG Logic
Series	SN74BCT8244A
Operating Supply Voltage	4.5 V to 5.5 V
Minimum Operating Temperature	0 C
Maximum Operating Temperature	+ 70 C
Package / Case	SOIC-24
Packaging	Tube
Operating Temperature Range	0 C to + 70 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Product Type	Specialty Function Logic
Factory Pack Quantity	25
Subcategory	Logic ICs
Tradename	SCOPE
Unit Weight	0.022025 oz

For more information, please refer to datasheet

Documents

SN74BCT8244ADW Datasheet

More Information

The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.