Description
SN74BCT8374ADW Texas Instruments - Yeehing Electronics
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 8.701 |
| 100 — 249 | 7.094 |
| 250 — 999 | 5.575 |
| 1,000 + | 3.31 |
The above prices are for reference only.
Specifications
| Manufacturer | Texas Instruments |
| Product Category | Specialty Function Logic |
| RoHS | Y |
| Series | SN74BCT8374A |
| Operating Supply Voltage | 4.5 V to 5.5 V |
| Minimum Operating Temperature | 0 C |
| Maximum Operating Temperature | + 70 C |
| Package / Case | SOIC-24 |
| Packaging | Tube |
| Number of Circuits | 1 |
| Operating Temperature Range | 0 C to + 70 C |
| Brand | Texas Instruments |
| Mounting Style | SMD/SMT |
| Number of Input Lines | 8 |
| Number of Output Lines | 8 |
| Product Type | Specialty Function Logic |
| Propagation Delay Time | 8.5 ns |
| Factory Pack Quantity | 25 |
| Subcategory | Logic ICs |
| Tradename | SCOPE |
| Unit Weight | 0.022025 oz |
For more information, please refer to datasheet
Documents
| SN74BCT8374ADW Datasheet |
More Information
The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
