SN74LVT8980ADW Texas Instruments - Yeehing Electronics

Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces

Pricing (USD)

Quantity	Unit Price
1 — 99	12.169
100 — 249	10.63
250 — 999	8.196
1,000 +	5.13

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Product	Boundry Scan JTAG Logic
Series	SN74LVT8980A
Operating Supply Voltage	2.7 V to 3.6 V
Minimum Operating Temperature	- 40 C
Maximum Operating Temperature	+ 85 C
Package / Case	SOIC-24
Packaging	Reel
Operating Temperature Range	- 40 C to + 85 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Product Type	Specialty Function Logic
Factory Pack Quantity	2000
Subcategory	Logic ICs
Unit Weight	0.022025 oz

For more information, please refer to datasheet

Documents

SN74LVT8980ADW Datasheet

More Information

The ’LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other devices of this family, the eTBCs are not boundary-scannable devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an embedded host microprocessor/microcontroller. Thus, the eTBCs enable the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels.