Description
SN74LVTH182502APM Texas Instruments - Yeehing Electronics
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 8.344 |
| 100 — 249 | 6.803 |
| 250 — 999 | 5.347 |
| 1,000 + | 3.17 |
The above prices are for reference only.
Specifications
| Manufacturer | Texas Instruments |
| Product Category | Specialty Function Logic |
| RoHS | Y |
| Series | SN74LVTH182502A |
| Operating Supply Voltage | 3.3 V |
| Minimum Operating Temperature | - 40 C |
| Maximum Operating Temperature | + 85 C |
| Package / Case | LQFP-64 |
| Packaging | Tray |
| Function | Scan Test Device with Universal Bus Transceiver |
| Number of Circuits | 2 |
| Operating Temperature Range | - 40 C to + 85 C |
| Brand | Texas Instruments |
| Mounting Style | SMD/SMT |
| Moisture Sensitive | Yes |
| Product Type | Specialty Function Logic |
| Propagation Delay Time | 7.7 ns |
| Factory Pack Quantity | 160 |
| Subcategory | Logic ICs |
| Tradename | SCOPE |
| Unit Weight | 0.011993 oz |
For more information, please refer to datasheet
Documents
| SN74LVTH182502APM Datasheet |
More Information
The LVTH18502A and LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
