Texas Instruments
SN74LVTH182504APM
SN74LVTH182504APM
Regular price
$2.39 USD
Regular price
Sale price
$2.39 USD
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SN74LVTH182504APM Texas Instruments - Yeehing Electronics
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 6.285 |
| 100 — 249 | 5.124 |
| 250 — 999 | 4.027 |
| 1,000 + | 2.39 |
The above prices are for reference only.
Specifications
| Manufacturer | Texas Instruments |
| Minimum Operating Temperature | -40 |
| Maximum Operating Temperature | 85 |
| Factory Pack Quantity | 160 |
| Package | Pins | LQFP (PM) | 64 |
For more information, please refer to datasheet
Documents
| SN74LVTH182504APM Datasheet |
More Information
The 'LVTH18504A and 'LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
