SN74LVTH182504APM Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	6.285
100 — 249	5.124
250 — 999	4.027
1,000 +	2.39

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Minimum Operating Temperature	-40
Maximum Operating Temperature	85
Factory Pack Quantity	160
Package | Pins	LQFP (PM) | 64

For more information, please refer to datasheet

Documents

SN74LVTH182504APM Datasheet

More Information

The 'LVTH18504A and 'LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.