SN74LVTH182512DGGR Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	6.6
100 — 249	5.381
250 — 999	4.229
1,000 +	2.51

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SN74LVTH182512DGGR Datasheet

More Information

The 'LVTH18512 and 'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.