SN74LVTH182512DGGR Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

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For more information, please refer to datasheet

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More Information

The 'LVTH18512 and 'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.