SN74LVTH18502APMR Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	6.953
100 — 249	5.669
250 — 999	4.455
1,000 +	2.65

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SN74LVTH18502APMR Datasheet

More Information

The ’LVTH18502A and ’LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.