SN74LVTH18512DGGR Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	6.285
100 — 249	5.124
250 — 999	4.027
1,000 +	2.39

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Series	SN74LVTH18512
Operating Supply Voltage	3.3 V
Minimum Operating Temperature	- 40 C
Maximum Operating Temperature	+ 85 C
Package / Case	TSSOP-64
Packaging	Reel
Function	Scan Test Device with Universal Bus Transceiver
Number of Circuits	2
Operating Temperature Range	- 40 C to + 85 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Product Type	Specialty Function Logic
Propagation Delay Time	6.8 ns
Factory Pack Quantity	2000
Subcategory	Logic ICs
Tradename	SCOPE
Unit Weight	0.009171 oz

For more information, please refer to datasheet

Documents

SN74LVTH18512DGGR Datasheet

More Information

The 'LVTH18512 and 'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.