Texas Instruments
SN74LVTH18514DGGR
SN74LVTH18514DGGR
Regular price
$2.73 USD
Regular price
Sale price
$2.73 USD
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SN74LVTH18514DGGR Texas Instruments - Yeehing Electronics
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 6.285 |
| 100 — 249 | 5.124 |
| 250 — 999 | 4.027 |
| 1,000 + | 2.73 |
The above prices are for reference only.
Specifications
| Manufacturer | Texas Instruments |
| Product Category | Specialty Function Logic |
| RoHS | Y |
| Series | SN74LVTH18514 |
| Operating Supply Voltage | 2.7 V to 3.6 V |
| Minimum Operating Temperature | - 40 C |
| Maximum Operating Temperature | + 85 C |
| Package / Case | TSSOP-64 |
| Packaging | Reel |
| Function | Scan Test Device with Universal Bus Transceiver |
| Number of Circuits | 1 |
| Operating Temperature Range | - 40 C to + 85 C |
| Brand | Texas Instruments |
| Mounting Style | SMD/SMT |
| Product Type | Specialty Function Logic |
| Propagation Delay Time | 7.4 ns |
| Factory Pack Quantity | 2000 |
| Subcategory | Logic ICs |
| Tradename | SCOPE |
| Unit Weight | 0.009263 oz |
For more information, please refer to datasheet
Documents
| SN74LVTH18514DGGR Datasheet |
More Information
The 'LVTH18514 and 'LVTH182514 scan test devices with 20-bit universal bus transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
