SN74LVTH18514DGGR


YeeHing #: Y009-SN74LVTH18514DGGR
Inventory: 5400

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Description

SN74LVTH18514DGGR Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers

Pricing (USD)

Quantity Unit Price
1 — 99 6.285
100 — 249 5.124
250 — 999 4.027
1,000 + 2.73

The above prices are for reference only.

Specifications

Manufacturer Texas Instruments
Product Category Specialty Function Logic
RoHS Y
Series SN74LVTH18514
Operating Supply Voltage 2.7 V to 3.6 V
Minimum Operating Temperature - 40 C
Maximum Operating Temperature + 85 C
Package / Case TSSOP-64
Packaging Reel
Function Scan Test Device with Universal Bus Transceiver
Number of Circuits 1
Operating Temperature Range - 40 C to + 85 C
Brand Texas Instruments
Mounting Style SMD/SMT
Product Type Specialty Function Logic
Propagation Delay Time 7.4 ns
Factory Pack Quantity 2000
Subcategory Logic ICs
Tradename SCOPE
Unit Weight 0.009263 oz

For more information, please refer to datasheet

Documents

SN74LVTH18514DGGR Datasheet

More Information

The 'LVTH18514 and 'LVTH182514 scan test devices with 20-bit universal bus transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

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