Texas Instruments
SN74LVTH18646APM
SN74LVTH18646APM
Regular price
$5.94 USD
Regular price
Sale price
$5.94 USD
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SN74LVTH18646APM Texas Instruments - Yeehing Electronics
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 14.092 |
| 100 — 249 | 12.309 |
| 250 — 999 | 9.491 |
| 1,000 + | 5.94 |
The above prices are for reference only.
Specifications
| Manufacturer | Texas Instruments |
| Product Category | Specialty Function Logic |
| RoHS | Y |
| Series | SN74LVTH18646A |
| Operating Supply Voltage | 3.3 V |
| Minimum Operating Temperature | - 40 C |
| Maximum Operating Temperature | + 85 C |
| Package / Case | LQFP-64 |
| Packaging | Tray |
| Function | Scan Test Device with Bus Transceiver / Register |
| Number of Circuits | 2 |
| Operating Temperature Range | - 40 C to + 85 C |
| Brand | Texas Instruments |
| Mounting Style | SMD/SMT |
| Moisture Sensitive | Yes |
| Product Type | Specialty Function Logic |
| Propagation Delay Time | 7.1 ns |
| Factory Pack Quantity | 160 |
| Subcategory | Logic ICs |
| Unit Weight | 0.012088 oz |
For more information, please refer to datasheet
Documents
| SN74LVTH18646APM Datasheet |
More Information
The 'LVTH18646A and 'LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
