SN74LVTH18646APM Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers

Pricing (USD)

Quantity	Unit Price
1 — 99	14.092
100 — 249	12.309
250 — 999	9.491
1,000 +	5.94

The above prices are for reference only.

Specifications

Manufacturer	Texas Instruments
Product Category	Specialty Function Logic
RoHS	Y
Series	SN74LVTH18646A
Operating Supply Voltage	3.3 V
Minimum Operating Temperature	- 40 C
Maximum Operating Temperature	+ 85 C
Package / Case	LQFP-64
Packaging	Tray
Function	Scan Test Device with Bus Transceiver / Register
Number of Circuits	2
Operating Temperature Range	- 40 C to + 85 C
Brand	Texas Instruments
Mounting Style	SMD/SMT
Moisture Sensitive	Yes
Product Type	Specialty Function Logic
Propagation Delay Time	7.1 ns
Factory Pack Quantity	160
Subcategory	Logic ICs
Unit Weight	0.012088 oz

For more information, please refer to datasheet

Documents

SN74LVTH18646APM Datasheet

More Information

The 'LVTH18646A and 'LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.