SN74LVTH18652APM Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers

Pricing (USD)

Quantity	Unit Price
1 — 99	14.092
100 — 249	12.309
250 — 999	9.491
1,000 +	5.94

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SN74LVTH18652APM Datasheet

More Information

The 'LVTH18652A and 'LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.