SN74LVTH18652APM Texas Instruments - Yeehing Electronics

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers

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For more information, please refer to datasheet

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More Information

The 'LVTH18652A and 'LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.