SNJ54ABT18502HV Texas Instruments - Yeehing Electronics

Scan Test Device With 18-Bit Registered Bus Transceiver

Pricing (USD)

Quantity	Unit Price
1 — 99	151.708
100 — 249	139.065
250 — 999	126.423
1,000 +	106.20

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SNJ54ABT18502HV Datasheet

More Information

The SN54ABT18502 scan test device with 18-bit universal bus transceiver is a member of the Texas Instruments SCOPETM testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.