SNJ54ABT18502HV Texas Instruments - Yeehing Electronics

Scan Test Device With 18-Bit Registered Bus Transceiver

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For more information, please refer to datasheet

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The SN54ABT18502 scan test device with 18-bit universal bus transceiver is a member of the Texas Instruments SCOPETM testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.