Description
SNJ54ABT8543FK Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Registered Bus Tranceivers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 141.262 |
| 100 — 249 | 137.013 |
| 250 — 999 | 114.072 |
| 1,000 + | 74.35 |
The above prices are for reference only.
Specifications
For more information, please refer to datasheet
Documents
| SNJ54ABT8543FK Datasheet |
More Information
The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
