SNJ54ABT8646FK Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Bus Transceivers And Registers

Pricing (USD)

Quantity	Unit Price
1 — 99	114.758
100 — 249	111.306
250 — 999	92.669
1,000 +	60.40

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SNJ54ABT8646FK Datasheet

More Information

The ’ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.