Description
SNJ54ABT8646JT Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Bus Transceivers And Registers
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 67.504 |
100 — 249 | 65.474 |
250 — 999 | 54.511 |
1,000 + | 35.53 |
The above prices are for reference only.
Specifications
For more information, please refer to datasheet
Documents
SNJ54ABT8646JT Datasheet |
More Information
The ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.