SNJ54ABTH18502AHV Texas Instruments - Yeehing Electronics

Scan Test Devices With 18-Bit Universal Bus Transceivers

Pricing (USD)

Quantity	Unit Price
1 — 99	138.229
100 — 249	126.71
250 — 999	115.191
1,000 +	96.76

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SNJ54ABTH18502AHV Datasheet

More Information

The 'ABTH18502A and 'ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.