Description
SNJ54BCT8240AFK Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Buffers
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 67.146 |
100 — 249 | 59.685 |
250 — 999 | 49.065 |
1,000 + | 30.72 |
The above prices are for reference only.
Specifications
For more information, please refer to datasheet
Documents
SNJ54BCT8240AFK Datasheet |
More Information
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.