Description
SNJ54BCT8244AFK Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal Buffers
Pricing (USD)
| Quantity | Unit Price |
| 1 — 99 | 70.351 |
| 100 — 249 | 62.534 |
| 250 — 999 | 51.407 |
| 1,000 + | 32.19 |
The above prices are for reference only.
Specifications
For more information, please refer to datasheet
Documents
| SNJ54BCT8244AFK Datasheet |
More Information
The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
