SNJ54BCT8244AJT Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Buffers

Pricing (USD)

Quantity	Unit Price
1 — 99	48.518
100 — 249	43.127
250 — 999	35.453
1,000 +	22.20

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SNJ54BCT8244AJT Datasheet

More Information

The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.