SNJ54BCT8245AJT


YeeHing #: Y009-SNJ54BCT8245AJT
Inventory: 3000

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Description

SNJ54BCT8245AJT Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal Bus Transceivers

Pricing (USD)

Quantity Unit Price
1 — 99 50.758
100 — 249 45.118
250 — 999 37.09
1,000 + 23.22

The above prices are for reference only.

Specifications

None

For more information, please refer to datasheet

Documents

SNJ54BCT8245AJT Datasheet

More Information

The 'BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

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