Description
SNJ54BCT8373AFK Texas Instruments - Yeehing Electronics
Scan Test Devices With Octal D-type Latches
Pricing (USD)
Quantity | Unit Price |
1 — 99 | 76.306 |
100 — 249 | 67.827 |
250 — 999 | 55.758 |
1,000 + | 34.91 |
The above prices are for reference only.
Specifications
For more information, please refer to datasheet
Documents
SNJ54BCT8373AFK Datasheet |
More Information
The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated-