SNJ54BCT8373AFK


YeeHing #: Y009-SNJ54BCT8373AFK
Inventory: 6600

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Description

SNJ54BCT8373AFK Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal D-type Latches

Pricing (USD)

Quantity Unit Price
1 — 99 76.306
100 — 249 67.827
250 — 999 55.758
1,000 + 34.91

The above prices are for reference only.

Specifications

None

For more information, please refer to datasheet

Documents

SNJ54BCT8373AFK Datasheet

More Information

The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated-

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