SNJ54BCT8374AFK Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops

Pricing (USD)

Quantity	Unit Price
1 — 99	67.638
100 — 249	65.604
250 — 999	54.619
1,000 +	35.60

The above prices are for reference only.

Specifications

For more information, please refer to datasheet

Documents

SNJ54BCT8374AFK Datasheet

More Information

The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.