SNJ54BCT8374AFK Texas Instruments - Yeehing Electronics

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops

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The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.