TAS5414BTPHDQ1


YeeHing #: Y002-TAS5414BTPHDQ1
Inventory: 7400

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Description

TAS5414BTPHDQ1 Texas Instruments - Yeehing Electronics

Automotive, 28-W, 4-ch, 6- to 24-V analog SE input Class-D audio amplifier w/ I2C diag & load dump

Pricing (USD)

Quantity Unit Price
1 — 99 14.782
100 — 249 12.912
250 — 999 9.956
1,000 + 6.23

The above prices are for reference only.

Specifications

Manufacturer Texas Instruments
Product Category Audio Amplifiers
RoHS Y
Series TAS5414B-Q1
Product Audio Amplifiers
Class Class-AB, Class-D
Output Power 150 W
Mounting Style SMD/SMT
Type 4-Channel Audio
Package / Case HTQFP-64
THD plus Noise 10 %
Supply Voltage - Max 24 V
Supply Voltage - Min 6 V
Minimum Operating Temperature - 40 C
Maximum Operating Temperature + 105 C
Qualification AEC-Q100
Packaging Tube
Input Type Analog
Brand Texas Instruments
Number of Channels 4 Channel
CMRR - Common Mode Rejection Ratio 60 dB
Moisture Sensitive Yes
Operating Supply Voltage 6 V to 24 V
Product Type Audio Amplifiers
PSRR - Power Supply Rejection Ratio 75 dB
Factory Pack Quantity 90
Subcategory Audio ICs
Unit Weight 0.017506 oz

For more information, please refer to datasheet

Documents

TAS5414BTPHDQ1 Datasheet

More Information

The TAS5414-Q1 and TAS5424-Q1 are four-channel digital audio amplifiers designed for use in automotive head units and external amplifier modules. They provide four channels at 23 W continuously into 4 Ω at less than 1% THD+N from a 14.4-V supply. Each channel can also deliver 38 W into 2 Ω at 1% THD+N. The TAS5414-Q1 uses single-ended analog inputs, while the TAS5424-Q1 employs differential inputs for increased immunity to common-mode system noise. The digital PWM topology of the device provides dramatic improvements in efficiency over traditional linear amplifier solutions. This reduces the power dissipated by the amplifier by a factor of ten under typical music playback conditions. The device incorporates all the functionality needed to perform in the demanding OEM applications area. They have built-in load diagnostic functions for detecting and diagnosing misconnected outputs to help to reduce test time during the manufacturing process.

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