UCC27325D


YeeHing #: Y012-UCC27325D
Inventory: 7000

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Description

UCC27325D Texas Instruments - Yeehing Electronics

4-A/4-A dual-channel gate driver with one inverting, one non-inverting input and hystertic logic

Pricing (USD)

Quantity Unit Price
1 — 99 1.129
100 — 249 0.932
250 — 999 0.67
1,000 + 0.35

The above prices are for reference only.

Specifications

Manufacturer Texas Instruments
Product Category Gate Drivers
RoHS Y
Type Low Side
Mounting Style SMD/SMT
Package / Case SOIC-8
Number of Drivers 2 Driver
Number of Outputs 2 Output
Output Current 4 A
Rise Time 23 ns
Fall Time 23 ns
Supply Voltage - Min 4 V
Supply Voltage - Max 15 V
Operating Supply Current 600 uA
Pd - Power Dissipation 1140 mW
Minimum Operating Temperature - 40 C
Maximum Operating Temperature + 125 C
Series UCC27325
Packaging Tube
Features Inverting and Non-inverting Output, Hysteretic Logic
Operating Temperature Range - 40 C to + 125 C
Technology Si
Brand Texas Instruments
Logic Type CMOS
Operating Supply Voltage 4 V to 15 V
Product Type Gate Drivers
Factory Pack Quantity 75
Subcategory PMIC - Power Management ICs
Unit Weight 0.002561 oz

For more information, please refer to datasheet

Documents

UCC27325D Datasheet

More Information

The UCC2732x and UCC3732x family of high-speed dual-MOSFET Drivers deliver 4-A source and 4-A sink peak current to effectively drive MOSFETs where it is needed most at the Miller Plateau Region. A unique BiPolar and MOSFET hybrid output stage in parallel also allows efficient current sourcing and sinking at low supply voltages. Three standard logic options are offered — dual-inverting, dual-noninverting, and one-inverting and one-noninverting driver. Input thresholds are based on TTL and CMOS and independent of supply voltage and feature wide input hysteresis offering excellent noise immunity. The UCC2732x and UCC3732x family is available in the standard SOIC-8 (D) or PDIP-8 (P) packages as well as the thermally enhanced -8pin PowerPAD MSOP package (DGN), drastically lowering thermal resistance to improve long term reliability.

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